00635     2200169   4500001002100000005001500021035002000036245006100056100002100117250004800138300004400186260004300230082001100273084001700284500015100301990001300452INLIS00000000000636020220610112025  a0010-06220002211 aOptimal System Eyes 3D IC Measurement /cTETSUO HIRAYAMA1 aHIRAYAMA, Tetsuo  aEdisi Vol. 20, Serial No. 221 February 2015  a76 halaman :bTabel, Gambar ;c21x28 cm  bDempa Asia Electronics Industry,c2015  a050.37  a050.37 HIR o  aSpecial Report : New Resistors Gain Waves Novel Resistors Find Way in Critical Devices 
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